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Electron beam x-ray microanalysis / Kurt F.J. Heinrich.


New York : Van Nostrand Reinhold Company, [1981] .
ISBN 0442232861, 9780442232863

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Subjects Electron probe microanalysis.
Elektronenoptik.
Mikroanalyse.
Röntgenspektroskopie.
Röntgenstrahlung.
X-ray spectroscopy.
Description xxiii, 578 pages, [4] leaves of plates : illustrations ; 24 cm
Copyright Date [1981]
©1981
Notes Includes bibliographical references and indexes.
Network Numbers (OCoLC)6043433
(OCoLC)ocm06043433
WorldCat Search OCLC WorldCat
WorldCat Identities Heinrich, Kurt F. J.
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