Stanford-Binet intelligence scale; manual for the third revision form L-M [by] Lewis M. Terman [and] Maud A. Merrill. With revised IQ tables by Samuel R. Pinneau.

; Merrill, Maud A. (Maud Amanda), b. 1888, author
Boston, Houghton Mifflin [1960] .

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Other Authors Merrill, Maud A. b. 1888,
Subjects Intelligence -- Tests.
Stanford-Binet Test.
Stanford-Binet, EĢchelle de.
Tests psychologiques.
Series Houghton Mifflin Company tests.
Description 363 pages illustrations 25 cm.
Copyright Date [1960]
Contents Part One: Essential features of the Stanford revisions -- 1. The first revision, 1916 -- 2. The second revision, 1937 : The 1937 revision a Binet type test ; Item selection ; Selection of subjects ; Reliability and validity -- 3. The third revision, 1960 : Preliminary considerations ; Criteria for the selection of items ; Locating items in the scale ; Factors affecting IQ variability ; IQ variability in relation to age ; Correlations between retests ; A frame of reference for classifying IQs ; Problems involved in test revision ; Essential features of the 1960 scale ; Sources of material for scale revision ; Determining the difficulty of items ; Procedures employed in the analysis of test records ; Clarification of scoring principles and test administration ; Changes in the 1960 scale ; Content ; Structural changes ; Revised IQ tables ; Shifts in item difficulty ; Characteristics of curves showing percents passing ; Validity and reliability ; Abilities sampled by the scales ; Factor analyses of Stanford-Binet test items ; Stratified samples at ages 6 and 15 ; The two-and-a-half-year-old sample ; Summary
Part Three: Revised intelligence quotient tables : Pinneau revised IQ tables ; Appendix A: Conversion tables ; Appendix B: Tests of the L-M scale in 1937 and 1960.
Part Two: Guide for administering and scoring -- Form L-M -- Testing Procedure -- General directions : Adherence to standard procedure ; Working within a frame ; Order of giving the tests ; General principles of procedure ; When may a question be repeated? ; Ambiguous responses ; The importance of rapport ; The testing of preschool children ; The appraisal of responses ; Mastery of the scoring rules ; Avoidance of the "halo" effect ; Scoring not purely mechanical ; Administering the tests ; The surroundings ; The presence of others ; Manipulating the test material ; Duration of examination ; To maintain standard conditions of testing ; Where to begin testing ; Scattering of successes ; Determining the basal age and ceiling (maximal) level ; Abbreviated tests ; Alternative tests ; Computation of MA scores ; Finding the IQ -- Specific instructions for administering Form L-M -- Scoring standards for Form L-M
Network Numbers (OCoLC)222791
(OCoLC)ocm00222791
WorldCat Search OCLC WorldCat
WorldCat Identities Terman, Lewis M. 1877-1956.
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