An electron diffraction study of the structure of amorphous silicon oxide films / by Clifford F. George, Jr.


1978.

Location Call Number Status Consortium Loan
Catholic
Archives Mss. and Museum Coll.(Non-Circulating)
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Archives Doct Theses Microform (Non-Circulating)
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WRLC Shared Collections Facility
QC1.C36 1978 G4 Off-site
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WRLC Shared Collections Facility
QC1.C36 1978 G4 Off-site
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Subjects Electrons -- Diffraction.
Silicon oxide films.
Description viii, 77 leaves : ill. ; 29 cm.
Notes Typescript.
Inlcudes bibliographical references.
Also available in Microfilm.
Thesis/Dissertation Thesis (Ph.D.--Physics)--Catholic University of America.

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